Study Reveals UV-Induced Degradation in N-Type Solar Modules, Influencing IEC Standards
A study led by Fraunhofer ISE has shed light on ultraviolet-induced degradation (UVID) in n-type solar modules, leading to updates in IEC standards. The research, published in Progress in Photovoltaics, focused on a 3 MW commercial rooftop PV system in a temperate U.S. zone, revealing significant power losses due to UVID.
The study centered around a 3 MW rooftop PV system using n-type modules with passivated emitter rear totally diffused (PERT) technology. Researchers from Fraunhofer ISE and NREL investigated UVID, finding that it causes cell surface recombination losses and lack of monkey type in metallization paste. Modules with zinc-containing paste also showed series resistance degradation after 1000 hours of damp heat testing.
After six years, fielded and unfielded modules were analyzed. UV exposure beyond IEC 61215-2 MQT10 standards was needed to replicate surface degradation and cause measurable power loss. Damp heat stress significantly increased series resistance in UV-exposed cells, but not in non-UV-stressed ones. The system showed modules degrading at approximately 2.4% per year relative to nameplate power.
The study's findings influenced the update of IEC standards, improving screening methods for early module failures. However, current standards may not fully assess long-term UVID risks due to minimal UV exposure requirements. Further research is needed to ensure accurate long-term performance predictions for n-type solar modules.
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